Tenth annual IEEE semiconductor thermal measurement and management symposium (Record no. 3232)

MARC details
000 -LEADER
fixed length control field 00542nam a22001337a 4500
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 0780318528 (pbk)
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.38152
Author Mark TEN
100 ## - MAIN ENTRY--PERSONAL NAME
Authorship Chappell Enterprises (compiler)
245 ## - TITLE STATEMENT
Title Tenth annual IEEE semiconductor thermal measurement and management symposium
Sub Title february 1-3, 1994 Red Lion Hotel San Jose, CA USA
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT)
Place of publication USA
Name of publisher NIST
Date of publication 1994
300 ## - PHYSICAL DESCRIPTION
Extent xi, 180 p.
Illustrations : ill.
Dimensions ; 27 cm.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Subject Semiconductor-Thermal properties
Keywords Thermal management
-- Thermal modeling
-- Semiconductor devices
-- Velocity
-- FEAS
942 ## - ADDED ENTRY ELEMENTS (KOHA)
item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Source of acquisition Full call number Barcode Copy number Koha item type
        Main Campus Main Campus Purchased 621.38152 TEN 3746 1 Books
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