Seventeenth annual IEEE semiconductor thermal measurement and management symposium (Record no. 3290)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00629nam a22001457a 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 10652221 (pbk) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 0780308638 (pbk) |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38152 |
| Author Mark | SEM |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Authorship | IEEE |
| 245 ## - TITLE STATEMENT | |
| Title | Seventeenth annual IEEE semiconductor thermal measurement and management symposium |
| Sub Title | March 20-22, 2001 Doubletree Hotel |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | Pisataway, NJ USA |
| Name of publisher | IEEE |
| Date of publication | 2001 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 259 p. |
| Illustrations | : ill. |
| Dimensions | ; 28 cm. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Subject | Semiconductor thermal |
| Keywords | Discrete component |
| -- | Environmental stress |
| -- | Semiconductor technology |
| -- | Semiconductor manufacturing |
| -- | Thermal measurement |
| -- | Thermal management |
| -- | Electrical |
| -- | Technology |
| -- | Material |
| -- | FEAS |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Source of acquisition | Full call number | Barcode | Copy number | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Main Campus | Main Campus | Purchased: Asia Foundation | 621.38152 SEM | 3747 | 1 | Books |