TY  - BOOK
AU  - Sachdev, Manoj
TI  - Defect-oriented testing for nano-metric CMOS VLSI circuits
SN  - 9788184894295 (pbk)
U1  - 621.39732 
PY  - 2007///
CY  - New Delhi
PB  - Springer
KW  - Integrated circuits--Very large scale
KW  - integration--Defects
KW  - Metal oxide semiconductors
KW  - Engineering
KW  - Systems engineering
KW  - Electronics
KW  - Engineering design
KW  - CMOS fault
KW  - SRAM test
KW  - Yield engineering
KW  - FEAS
N1  - Includes bibliographical references and index
ER  -