Laung-Terng Wang (editor)  Cheng-Wen Wu (editor)  Xiaoqing Wen (editor) <br/><br/>
VLSI test principles and architectures  design for test ability 

 - India  Elsevier  2006 
 - xxx, 777 p.  : ill.  ; 24 cm. 
<br/><br/> Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>9789380501550 (pbk) 9780123705976 (pbk) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>VLSI<br/>Design for test ability--VLSI life-cycle  --level of abstraction in VLSI--Fault simulation --Test generation--Test compression--FEAS
<br/><br/><label>Dewey Class. No.: </label>621.395  / VLS