00645nam a22001577a 4500 9789380501550 (pbk) 9780123705976 (pbk) 621.395 VLS Laung-Terng Wang (editor) Cheng-Wen Wu (editor) Xiaoqing Wen (editor) VLSI test principles and architectures design for test ability India Elsevier 2006 xxx, 777 p. : ill. ; 24 cm. Includes bibliographical references and index. VLSI Design for test ability VLSI life-cycle level of abstraction in VLSI Fault simulation Test generation Test compression FEAS BK 0 0 0 0 RIU RIU 2014-05-24 Purchased: Allied Book Company 1074.00 0 621.395 VLS 20825 2014-05-24 00:00:00 1 2019-02-21 BK 12416 12416