TY  - BOOK
AU  - Laung-Terng Wang (editor)
TI  - VLSI test principles and architectures: design for test ability
SN  - 9789380501550 (pbk)
U1  - 621.395 
PY  - 2006///
CY  - India
PB  - Elsevier
KW  - VLSI
KW  - Design for test ability
KW  - VLSI life-cycle
KW  - level of abstraction in VLSI
KW  - Fault simulation
KW  - Test generation
KW  - Test compression
KW  - FEAS
N1  - Includes bibliographical references and index
ER  -