00798nam a22001697a 4500020002400000020002400024082001700048100007600065245006800141260002600209300003400235500005100269650014300320942000700463952014100470999001700611  a9789380501550 (pbk)  a9780123705976 (pbk)  a621.395bVLS  aLaung-Terng Wang (editor)aCheng-Wen Wu (editor)aXiaoqing Wen (editor)  aVLSI test principles and architecturesbdesign for test ability  aIndiabElsevierc2006  axxx, 777 p.b: ill.c; 24 cm.  aIncludes bibliographical references and index.  aVLSIaDesign for test abilityvVLSI life-cycle  vlevel of abstraction in VLSIvFault simulation vTest generationvTest compressionvFEAS  cBK  00104070aRIUbRIUd2014-05-24ePurchased: Allied Book Companyg1074.00l0o621.395 VLSp20825r2014-05-24 00:00:00t1w2019-02-21yBK  c12416d12416