00601nam a22001337a 4500020002400000020002400024082001700048100007600065245006800141260003000209300003400239500005100273650014300324  a9789380501550 (pbk)  a9780123705976 (pbk)  a621.395bVLS  aLaung-Terng Wang (editor)aCheng-Wen Wu (editor)aXiaoqing Wen (editor)  aVLSI test principles and architecturesbdesign for test ability  aNew DelhibElsevierc2013  axxx, 777 p.b: ill.c; 24 cm.  aIncludes bibliographical references and index.  aVLSIaDesign for test abilityvVLSI life-cycle  vlevel of abstraction in VLSIvFault simulation vTest generationvTest compressionvFEAS