Kaufmann, Elton N.(editor) creator text Hoboken, New Jersey John Wiley & Sons, Inc. 2012 monographic vii, 1671 p. : ill. ; 28.5 cm. First edition published as a two volume set, Ã2003. Includes index. Second edition including Volume 1, 2 & 3 Technology and engineering-Material Science Physics Scanning probe techniques Ion-Beam techniques Materials research Materials testing Thermal analysis Resonance methods X-Ray techniques Electron techniques Neutron techniques Optical imaging Spectroscopy RICAS 548.5 CHA 9781118414453 (hb) 9781118414460 (hb) 9781118414477 (hb)