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  <titleInfo>
    <title>Principles of measurement systems</title>
  </titleInfo>
  <name type="personal">
    <namePart>Bentley, John P.</namePart>
    <role>
      <roleTerm authority="marcrelator" type="text">creator</roleTerm>
    </role>
  </name>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">New Delhi</placeTerm>
    </place>
    <publisher>Pearson Education (pvt) limited</publisher>
    <dateIssued>2008</dateIssued>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <extent>480 p. : ill. ; 24 cm.</extent>
  </physicalDescription>
  <note>Includes index. </note>
  <subject>
    <topic>Physical measurement Physical instrument-Loading effect-Measurements system</topic>
    <topic>Flow measurement system</topic>
    <topic>Optical measurement system</topic>
    <topic>Measurement system</topic>
    <topic>Dynamic characteristics</topic>
    <topic>Signal processing</topic>
    <topic>Data presentation</topic>
    <topic>Heat transfer</topic>
    <topic>Ultrasonic measurement</topic>
    <topic>Gas chromatography</topic>
    <topic>FEAS</topic>
  </subject>
  <classification authority="ddc">621.381548 BEN</classification>
  <identifier type="isbn">9788131701829 (pbk)</identifier>
  <recordInfo/>
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