00455nam a22001097a 4500020002100000082002100021100002100042245003900063260005400102300003700156650015200193  a0201144034 (hb)   a621.381537bBEN   aBennetts, R. G.   aDesign of testable logic circuits   aLondon bAddison Wesley Publishing Company c1984  axii, 164 p. b: ill. c; 24 cm.   aLogic circuits aDesign of testable vElectrical engineering vDesign testable vLogic circuits vMicroelectronics vTestability measurement vFEAS