TY  - BOOK
AU  - Grout,Ian A.
TI  - Integrated circuit test engineering: modern techniques
SN  - 1846280230 (pbk)
U1  - 621.381548 
PY  - 2006///
CY  - London
PB  - Springer
KW  - Integrated circuits
KW  - Structured test approaches
KW  - Digital logic test
KW  - Fabrication processes
KW  - Analogue test
KW  - Test economics
KW  - FEAS
ER  -