IEEE <br/><br/>
Ninth annual IEEE semiconductor thermal measurement and management symposium  February 2-4, 1993 Four Seasons Hotel Austin, TX USA 

 - Austin, TX, USA  IEEE  1993 
 - x, 214 p.  : ill.   ; 28 cm. 
<br/><br/><label>ISBN: </label>10652221 (pbk) 0780308638 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor thermal --Environmental stress--Discrete component--Semiconductor technology--Semiconductor manufacturing--Thermal management--Thermal measurement--Electrical --Technology--Material--FEAS
<br/><br/><label>Dewey Class. No.: </label>621.38152  / SEM