00590nam a22001217a 4500020001900000020001500019082001900034100000900053245013500062260003200197300003300229650020600262  a10652221 (pbk)  a0780308638  a621.38152bSEM  aIEEE  aNinth annual IEEE semiconductor thermal measurement and management symposiumbFebruary 2-4, 1993 Four Seasons Hotel Austin, TX USA  aAustin, TX, USAbIEEEc1993  ax, 214 p.b: ill. c; 28 cm.  aSemiconductor thermal vEnvironmental stressvDiscrete componentvSemiconductor technologyvSemiconductor manufacturingvThermal managementvThermal measurementvElectrical vTechnologyvMaterialvFEAS