00777nam a22001577a 4500952012900000999001500129020001900144020001500163082001900178100000900197245013500206260003200341300003300373650020600406942000700612  00104070aRIUbRIUd2012-07-31ePurchased: Asia Foundationl0o621.38152 SEMp3748r2012-07-31 00:00:00t1w2019-02-21yBK  c3120d3120  a10652221 (pbk)  a0780308638  a621.38152bSEM  aIEEE  aNinth annual IEEE semiconductor thermal measurement and management symposiumbFebruary 2-4, 1993 Four Seasons Hotel Austin, TX USA  aAustin, TX, USAbIEEEc1993  ax, 214 p.b: ill. c; 28 cm.  aSemiconductor thermal vEnvironmental stressvDiscrete componentvSemiconductor technologyvSemiconductor manufacturingvThermal managementvThermal measurementvElectrical vTechnologyvMaterialvFEAS  cBK