Chappell Enterprises (compiler)  <br/><br/>
Tenth annual IEEE semiconductor thermal measurement and management symposium   february 1-3, 1994 Red Lion Hotel San Jose, CA USA 

 - USA  NIST   1994 
 - xi, 180 p.  : ill.  ; 27 cm. 
<br/><br/><label>ISBN: </label>0780318528 (pbk) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor-Thermal properties --Thermal management --Thermal modeling --Semiconductor devices --Velocity --FEAS 
<br/><br/><label>Dewey Class. No.: </label>621.38152  / TEN