IEEE <br/><br/>
Seventeenth annual IEEE semiconductor thermal measurement and management symposium  March 20-22, 2001 Doubletree Hotel 

 - Pisataway, NJ USA  IEEE  2001 
 - 259 p.  : ill.   ; 28 cm. 
<br/><br/><label>ISBN: </label>10652221 (pbk) 0780308638 (pbk) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor thermal --Discrete component--Environmental stress--Semiconductor technology--Semiconductor manufacturing--Thermal measurement--Thermal management--Electrical --Technology--Material--FEAS
<br/><br/><label>Dewey Class. No.: </label>621.38152  / SEM