00770nam a22001577a 4500952012900000999001500129020001900144020002100163082001900184100000900203245012300212260003400335300003000369650020600399942000700605  00104070aRIUbRIUd2012-08-01ePurchased: Asia Foundationl0o621.38152 SEMp3747r2012-08-01 00:00:00t1w2019-02-21yBK  c3290d3290  a10652221 (pbk)  a0780308638 (pbk)  a621.38152bSEM  aIEEE  aSeventeenth annual IEEE semiconductor thermal measurement and management symposiumbMarch 20-22, 2001 Doubletree Hotel  aPisataway, NJ USAbIEEEc2001  a259 p.b: ill. c; 28 cm.  aSemiconductor thermal vDiscrete componentvEnvironmental stressvSemiconductor technologyvSemiconductor manufacturingvThermal measurementvThermal managementvElectrical vTechnologyvMaterialvFEAS  cBK