Baker, R. Jacob, Harry W. Li David E.Boyce

CMOS circuit design, layout, and simulation - New York IEEE Press 1998 - xxiv, 902 p. : ill. ;24 cm.

0780334167 (pbk)


Metal oxide semiconductors, Complementary--Integrated circuits--Metal oxide semiconductor field-effect transistors--Design and construction--Metal layers --MOSFST--CMOS passive elements --FEAS

621.3815 / BAK