Baker, R. Jacob, Harry W. Li David E.Boyce
CMOS circuit design, layout, and simulation
- New York IEEE Press 1998
- xxiv, 902 p. : ill. ;24 cm.
0780334167 (pbk)
Metal oxide semiconductors, Complementary--Integrated circuits--Metal oxide semiconductor field-effect transistors--Design and construction--Metal layers --MOSFST--CMOS passive elements --FEAS
621.3815 / BAK