circuit design, layout, and simulation Baker, R. Jacob, Harry W. Li David E.Boyce creator text New York IEEE Press 1998 monographic xxiv, 902 p. : ill. ;24 cm. Metal oxide semiconductors, Complementary Integrated circuits Metal oxide semiconductor field-effect transistors Design and construction Metal layers MOSFST CMOS passive elements FEAS 621.3815 BAK 0780334167 (pbk)