Buerger, Martin J. <br/><br/>
Crystal-structure analysis 

 - New York  John Wiley & Sons, Inc.  1960 
 - xvii, 668 p.  : ill.  ; 24 cm. 
<br/><br/> Includes index. 
<br/><br/><label>ISBN: </label>(hb) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Structural crystallography --Crystal imperfection--Geometrical factors--Atomic scattering --Wave motion--RIPS
<br/><br/><label>Dewey Class. No.: </label>548.81  / BUE