<?xml version="1.0" encoding="UTF-8"?>
<mods xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns="http://www.loc.gov/mods/v3" version="3.1" xsi:schemaLocation="http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-1.xsd">
  <titleInfo>
    <title>Understanding new developments in data acquisition, measurement, and control</title>
    <subTitle>a practical guide to high performance test and measurement</subTitle>
  </titleInfo>
  <typeOfResource>text</typeOfResource>
  <originInfo>
    <place>
      <placeTerm type="text">Ohio</placeTerm>
    </place>
    <publisher>Keithley</publisher>
    <issuance>monographic</issuance>
  </originInfo>
  <physicalDescription>
    <extent>iv, various pages. : ill . ; 22 cm .</extent>
  </physicalDescription>
  <note>Includes glossary and appendices.</note>
  <subject>
    <topic>Acquisition databases</topic>
    <topic>Industrial computer expansion</topic>
    <topic>Data acquisition</topic>
    <topic>Connection theory</topic>
    <topic>DBS</topic>
    <topic>FEAS</topic>
  </subject>
  <classification authority="ddc">530.8 UND</classification>
  <identifier type="isbn">(pbk)</identifier>
  <recordInfo/>
</mods>
