Loretto, M.H.  R.E. Smallman <br/><br/>
Defect analysis in electron microscopy  

 - London  Chapman And Hall  1975 
 - ix, 133 p.  : ill.  ; 23 cm. 
<br/><br/> Includes Index 
<br/><br/><label>ISBN: </label>047054760 X (pbk) 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Crystal-Defects<br/>Electron microscopy--Microscope operation--Weak-Beam microscopy--Partial dislocations--Microscopy--IIMC
<br/><br/><label>Dewey Class. No.: </label>548.84  / LOR