00495nam a22001457a 4500 047054760 X (pbk) 548.84 LOR Loretto, M.H. R.E. Smallman Defect analysis in electron microscopy London Chapman And Hall 1975 ix, 133 p. : ill. ; 23 cm. Includes Index Crystal-Defects Electron microscopy Microscope operation Weak-Beam microscopy Partial dislocations Microscopy IIMC BK 0 0 0 0 IMC IMC 2013-01-10 Purchased 0 548.84 LOR 10921 2013-01-10 00:00:00 1 2013-01-10 BK 7290 7290