TY  - BOOK
AU  - Loretto, M.H.
TI  - Defect analysis in electron microscopy 
SN  - 047054760 X (pbk)
U1  - 548.84 
PY  - 1975///
CY  - London
PB  - Chapman And Hall
KW  - Crystal-Defects
KW  - Electron microscopy
KW  - Microscope operation
KW  - Weak-Beam microscopy
KW  - Partial dislocations
KW  - Microscopy
KW  - IIMC
N1  - Includes Index
ER  -