000			00887cam a2200205 i 4500
020			_a9781118414453 (hb)
020			_a9781118414460 (hb)
020			_a9781118414477 (hb)
082	0	0	_a548.5 _bCHA
100			_aKaufmann, Elton N.(editor)
245	0	0	_aCharacterization of materials
260			_aHoboken, New Jersey _bJohn Wiley & Sons, Inc., _c2012
300			_avii, 1671 p. _b: ill. _c; 28.5 cm.
500			_aFirst edition published as a two volume set, Ã2003.
500			_aIncludes index.
500			_aSecond edition including Volume 1, 2 & 3
650		0	_aTechnology and engineering-Material Science _aPhysics _vScanning probe techniques _vIon-Beam techniques _vMaterials research _vMaterials testing _vThermal analysis _vResonance methods _vX-Ray techniques _vElectron techniques _vNeutron techniques _vOptical imaging _vSpectroscopy _vRICAS
942			_cREF
999			_c23771 _d23771