000 00501nam a22001337a 4500
020 _a0201144034 (hb)
082 _a621.381537
_bBEN
100 _aBennetts, R. G.
245 _aDesign of testable logic circuits
260 _aLondon
_bAddison Wesley Publishing Company
_c1984
300 _axii, 164 p.
_b: ill.
_c; 24 cm.
650 _aLogic circuits
_aDesign of testable
_vElectrical engineering
_vDesign testable
_vLogic circuits
_vMicroelectronics
_vTestability measurement
_vFEAS
942 _cBK
999 _c2934
_d2934