000 00497cam a22001457a 4500
999 _c3033
_d3033
020 _a1846280230 (pbk)
020 _a9781846280238
082 0 0 _a621.381548
_bGRO
100 1 _aGrout, Ian A.
245 1 0 _aIntegrated circuit test engineering
_bmodern techniques
260 _aLondon
_bSpringer
_c2006
300 _axxx, 362 p.
_b: ill.
_c; 24 cm.
650 0 _aIntegrated circuits
_vStructured test approaches
_vDigital logic test
_vFabrication processes
_vAnalogue test
_vTest economics
_vFEAS
942 _cBK