000			00636nam a22001457a 4500
999			_c3120 _d3120
020			_a10652221 (pbk)
020			_a0780308638
082			_a621.38152 _bSEM
100			_aIEEE
245			_aNinth annual IEEE semiconductor thermal measurement and management symposium _bFebruary 2-4, 1993 Four Seasons Hotel Austin, TX USA
260			_aAustin, TX, USA _bIEEE _c1993
300			_ax, 214 p. _b: ill. _c; 28 cm.
650			_aSemiconductor thermal _vEnvironmental stress _vDiscrete component _vSemiconductor technology _vSemiconductor manufacturing _vThermal management _vThermal measurement _vElectrical _vTechnology _vMaterial _vFEAS
942			_cBK