| 000 | 00629nam a22001457a 4500 | ||
|---|---|---|---|
| 999 |
_c3290 _d3290 |
||
| 020 | _a10652221 (pbk) | ||
| 020 | _a0780308638 (pbk) | ||
| 082 |
_a621.38152 _bSEM |
||
| 100 | _aIEEE | ||
| 245 |
_aSeventeenth annual IEEE semiconductor thermal measurement and management symposium _bMarch 20-22, 2001 Doubletree Hotel |
||
| 260 |
_aPisataway, NJ USA _bIEEE _c2001 |
||
| 300 |
_a259 p. _b: ill. _c; 28 cm. |
||
| 650 |
_aSemiconductor thermal _vDiscrete component _vEnvironmental stress _vSemiconductor technology _vSemiconductor manufacturing _vThermal measurement _vThermal management _vElectrical _vTechnology _vMaterial _vFEAS |
||
| 942 | _cBK | ||