000			00495nam a22001457a 4500
020			_a047054760 X (pbk)
082			_a548.84 _bLOR
100			_aLoretto, M.H. _aR.E. Smallman
245			_aDefect analysis in electron microscopy
260			_aLondon _bChapman And Hall _c1975
300			_aix, 133 p. _b: ill. _c; 23 cm.
500			_aIncludes Index
650			_aCrystal-Defects _aElectron microscopy _vMicroscope operation _vWeak-Beam microscopy _vPartial dislocations _vMicroscopy _vIIMC
942			_cBK
999			_c7290 _d7290