Defect analysis in electron microscopy
Loretto, M.H. R.E. Smallman
Defect analysis in electron microscopy - London Chapman And Hall 1975 - ix, 133 p. : ill. ; 23 cm.
Includes Index
047054760 X (pbk)
Crystal-Defects
Electron microscopy--Microscope operation--Weak-Beam microscopy--Partial dislocations--Microscopy--IIMC
548.84 / LOR
Defect analysis in electron microscopy - London Chapman And Hall 1975 - ix, 133 p. : ill. ; 23 cm.
Includes Index
047054760 X (pbk)
Crystal-Defects
Electron microscopy--Microscope operation--Weak-Beam microscopy--Partial dislocations--Microscopy--IIMC
548.84 / LOR