Defect analysis in electron microscopy (Record no. 7290)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00495nam a22001457a 4500 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| ISBN | 047054760 X (pbk) |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 548.84 |
| Author Mark | LOR |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Authorship | Loretto, M.H. |
| -- | R.E. Smallman |
| 245 ## - TITLE STATEMENT | |
| Title | Defect analysis in electron microscopy |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication | London |
| Name of publisher | Chapman And Hall |
| Date of publication | 1975 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | ix, 133 p. |
| Illustrations | : ill. |
| Dimensions | ; 23 cm. |
| 500 ## - GENERAL NOTE | |
| General note | Includes Index |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Subject | Crystal-Defects |
| -- | Electron microscopy |
| Keywords | Microscope operation |
| -- | Weak-Beam microscopy |
| -- | Partial dislocations |
| -- | Microscopy |
| -- | IIMC |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| item type | Books |
| Withdrawn status | Lost status | Damaged status | Not for loan | Home library | Current library | Source of acquisition | Full call number | Barcode | Copy number | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|
| Al-Mizan Campus | Al-Mizan Campus | Purchased | 548.84 LOR | 10921 | 1 | Books |