Defect-oriented testing for nano-metric CMOS VLSI circuits

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Material type: Text

TextPublication details: New Delhi Springer 2007Description: xxi, 328 p. : ill. ; 22 cmISBN:

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List(s) this item appears in: FEAS G-Books July 2026

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Item type	Current library	Call number	Copy number	Status	Date due	Barcode
Books	Main Campus	621.39732 SAC (Browse shelf(Opens below))	1	Available		20830

Includes bibliographical references and index.

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