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Defect analysis in electron microscopy

By: Material type: TextTextPublication details: London Chapman And Hall 1975Description: ix, 133 p. : ill. ; 23 cmISBN:
  • 047054760 X (pbk)
Subject(s): DDC classification:
  • 548.84 LOR
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Item type Current library Call number Copy number Status Date due Barcode
Books Books Al-Mizan Campus 548.84 LOR (Browse shelf(Opens below)) 1 Available 10921

Includes Index

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